High End Substrate Flying Probe Test System

S3-8 is the double sided model of the single sided S3 System. The S3-8 has 8 test heads and 2 high resolution cameras, one on the top side and one on the bottom side. The shuttle of the S3-8 can clamp and tension double sided substrate boards. For single sided tests the S3-8 can be equipped with a vacuum shuttle, which can be easily mounted.

 

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KEY FEATURES

• Highest accuracy to test state-of-the-art substrate products
• 8 test heads 
• Double sided system for ohmic testing 
• Optional vacuum plate can be fitted within 10 minutes for single sided test
• 10 µm pad size and 25 µm pitch
• Max. product size 350mm x 310mm (13.8″ x 12.2″)
• Cameras with 1.2 µm Resolution per pixel

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MACHINE FEATURES

MECHANICS

• Max. Panelsize: 350mm x 310mm (13.8" x 12.2")
• Test area: 350mm x 310mm (13.8" x 12.2")
• Board thickness: 0.05mm to 3mm
• 8 Test heads (4 top / 4 bottom)
• 1 high resolution color camarea for optical scaning op top side
• Resolution 1.2µm pixel
• Smallest Pad: 10µm / 0.4mil (special setup)
• Smallest Pitch: 25µm / 1.0 mil
• Resolution measurement system: ± 0.1µm (± 0.004 mil)
• Repeatable accuracy ± 1.5µm (± 0.06 mil)
• Micro needle probes: 0.3g to 2.5g
• Soft landing

ELECTRONICS

• Continuity test: 1Ω - 10kΩ
• Isolation test:
  • Up to 25MΩ (FM) 
• • Up to 10GΩ (Ohmic)
  • MicroShort Detection®
• Test voltage: 100mV to 1000V

GENERAL CONNECTIONS

• Data input format: IPC-D-356A
• Network connection: Ethernet, TCP/IP
• Power Supply: 3x 400V, 50Hz (3x 208V, 60Hz), 1000VA
• Compressed air: 8 bar/115psi filtered
• Temperature: 18°C to 24°C
• Relative humidity: 40% to 60%
• Machine weight: 1350kg

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OPTIONS 

• 4-wire Kelvin measurement with max. 300mA test current:
  
  • 0Ω to 1kΩ - Tolerance ± 2%, min. ± 25µΩ
  • with FP Kelvin probes contact pressure 0.3g to 2g
  • Smallest pad: 30µm (1.2 mil)*
  • Smallest pitch: 80µm ( 3.2 mil)*
  *with Kelvin probe fine adjustment
• Embedded Component test:
  • R 0Ω - 1MΩ - Tolerance ± 1%, min. ± 0.5Ω |1MΩ - 200MΩ - Tolerance ± 3% 
  • C 0F - 100µF - Tolerance ± 2%, min. ± 30fF
  • L 0H - 10mH - Tolerance ± 5%, min. ± 0.25µH
• Diode/Varistor:
  • Diode Varistor U_F,U_R, U_BR 100mV to 12.5V
  • Structural test of integrated circuits: opens/shorts test on CMOS devices with ESD diodes
• Multi-Point Measurements:
  • Up to three AC/DC sources (voltages and current) simultaneously
  • Transistors (MOSFET and Bipolar), Optocouplers, Fuses, Relays, Transformers, etc. 
  • Imax=300mA
• Repair software with barcode support 

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All information subject to change without notice!

For more information, visit the website or send us your information request.