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Flying Probe Test System for Substrates

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Substrates with structures down to 10µm and several hundred thousand test points per panel require specific solutions for

  • scanning
  • capacitance measurement
  • high accuracy and temperature Management

Overview of Substrate Flying Probe test Systems

S2 16cf ds front

 

 

 

• S2 plus
  Developed for HDI & Substrate Products

 

 

S2 16cf ds front




 • S2-16 plus
  Developed for HDI & Substrate Products

 

 

S3 side






 • S3
  High End Substrate Flying Probe Test System

 

 

S3 8 Prototyp




• s3-8
  High Speed - High End Substrate Flying Probe Test System

 

 

All information subject to change without notice!