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S3

High End Substrate Flying Probe Test System

  S3 side

atg Luther & Maelzer launched the S3, which is able to test 10µm structures while achieving 100 measurements per second. The machine therefore provides the customer with an economical test solution for high end substrates. The S3 provides the highest accuracy with the best performance to test the latest technology of substrate boards. The S3 has a granite frame, which gives the best temperature stability. The high resolution cameras of 1.2 µm per pixel provide the functionality to automatically scan and test 10 µm structures reliably.

 Key Features

  • highest accuracy to test state-of-the-art substrate products
  • 4 test heads and single sided test against vacuum plate
  • 10 µm pad size and 25 µm pitch
  • max. product size 300 mm x 310 mm (11.8″ x 12.2″)
  • cameras with 1.2 µm Resolution per pixel

Mechanics

  • Max. Panelsize: 330 x 310mm (13" x 12.2")
  • Test area: 300 x 310mm (11.8" x 12.2" )
  • Board thickness: 0.05mm to 3mm
  • 8 Test heads (4 top / 4 bottom)
  • 1 high resolution color camarea for optical scaning op top side
  • Resolution 1.2µm pixel
  • Smallest Pad: 10µm / 0.4mil * special setup
  • Smallest Pitch: 25µm
  • Resolution measurement system: ± 0.1µm (± 0.004 mil)
  • Repeatable accuracy ± 1.5µm (± 0.06 mil)
  • Micro needle probes: 0.3g to 2.5g
  • Soft landing

Electronics

  • Continuity test: 1Ω - 10 kΩ
  • Capacitance test: 10fF to 1000µF
  • Low voltage range: 100mV to 10V
  • Isolation test:
  • up to 25MΩ (FM) 
  • up to 10GΩ (Ohmic)
  • MicroShort Detection®
  • Test voltage • up to 1000V

Options

  • 4-wire Kelvin measurement with max. 300mA test current
  • 0.1mΩ to 300kΩ - Tolerance ± 2%, min. ± 0.025mΩ
  • with Kelvin probes contact pressure 0.2g to 2.5g
  • Smallest pad: 50µm ( 2.0 mil)*
  • Smallest pitch: 80µm ( 3.2 mil) * with Kelvin probe fine adjustment

Embedded Component test

  • R 0.5Ω - 10MΩ - Tolerance ± 0.5 %, min. ± 0.5Ω
  • > 10MΩ - 50MΩ - Tolerance ± 2 % 
  • C 0.1pF 100µF - Tolerance ± 2 %, min. ± 0.03pF
  • L 0.2µH to 5mH - Tolerance ± 3 %, min. ± 0.1µH
  • Diode Varistor  UF,UR, UBR 100mV to 12.5V
      Structural test of integrated circuits
     opens/shorts test on CMOS devices with ESD diodes

  • Multi-Point Measurements
    Up to three AC/DC sources (voltages and current) simultaneously
    Transistors (MOSFET and Bipolar), Optocouplers, Fuses, Relays, Transformers, etc.
    Imax=300mA
  • Repair software with barcode support

General connections

  • Data input format: IPC-D-356A
  • Network connection: Ethernet, TCP/IP
  • Power Supply: 3x 400V, 50Hz (3x 208V, 60Hz), 1200VA
  • Compressed air: 8 bar/115psi filtered
  • Temperature: 18°C t0 24°C
  • Relative humidity: 40% to 60%
  • Machine weight: 940kg


All information subject to change without notice!

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For more information, visit the website or send us your information request.