Bareboard Inspection (Phoenix Family)
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Phoenix UltimaPhoenix Ultima is designed to support high volume manufacturing of IC Substrates. It is capable to scan down to to 4 µm line/space width technology. Phoenix NanoPhoenix Nano is designed to support high volume manufacturing of IC substrates. It is capable to scan down to 5 µm line/space width technology. Phoenix MicroPhoenix Micro is designed to support high volume manufacturing of of IC Substrates. It is capable to scan down to 7 µm line/space width technology. Phoenix MaximaPhoenix Maxima is designed to support high volume manufacturing of IC Substrates and ultra fine line HDI. It is capable to scan down to 10 µm line/space width technology. |
Bareboard Inspection (Galaxy Family)
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Galaxy 4χGalaxy 4χ is designed to support high volume manufacturing of IC Substrates. It is capable to scan down to to 4 µm line/space width technology. Galaxy 5χGalaxy 5χ is designed to support high volume manufacturing of IC substrates. It is capable to scan down to 5 µm line/space width technology. Galaxy 7χGalaxy 7χ is designed to support high volume manufacturing of of IC Substrates. It is capable to scan down to 7 µm line/space width technology. Galaxy 10χGalaxy 10χ is designed to support high volume manufacturing of IC Substrates and ultra fine line HDI. It is capable to scan down to 10 µm line/space width technology. |
Verification Systems
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CVR 100 ICCVR 100 IC, CIMS verification station, is designed to support high volume manufacturing of IC Substrates. It is optimized for verification of 5 ~ 25 µm line/space width technology. . CVR 100 FLCVR 100 FL, CIMS verification station, is designed to support high volume manufacturing of HDI and IC Substrates. It is optimized for verification of 10 ~ 30 µm line/space width technology. |
Hybrid Verification Systems
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VVR for ICSVVR, CIMS verification station that combines virtual and physical verification within a single workstation. VVR for ICS is optimized for verification of 4 ~ 15 µm line/space width technology. |
Photo-Tools Inspection
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Phoenix PT/MicroPhoenix PT/Micro, CIMS photo-tools AOI system, is designed to inspect high-resolution film artworks and glass masks. It is capable to scan down to 7 µm line/space width technology. Phoenix PT+Phoenix PT+, CIMS photo-tools AOI system, is designed to inspect high-resolution film artworks and glass masks. It is capable to scan down to 12.5 µm line/space width technology. |
All information subject to change without notice!