Double and Quad Density Test System Medium to High Density Accuracy Economical Efficency Automatic Optical Alignment Low Ohm Testing
Testfield Size Maximum (X x Y) 325 x 244 mm / 12.8” x 9.6” (smaller fi eld sizes available upon request) Board Handling Minimum board size (X x Y) 50 x 50 mm / 1.97” x 1.97” Maximum board size (X x Y) 365 x 284 mm / 14.4” x 11.2” Minimum board thickness - manual testing 0.1 mm / 0.0039” - automatic testing 0.6 mm / 0.023” Maximum board thickness 8 mm / 0.315”
Testpoints (1 mil = 1 / 1000 inch = 0.025 mm) In 70 mil (200 testpoints / inch²) one side / both sides 24,576 / 49,152 50 mil (400 testpoints / inch²) 49,152 / 98,304
Test Parameters Test Voltage 40 to 250 VDC Continuity Threshold 10 Ù to 10 k Ù Isolation Threshold 100 k Ù to 100 M Ù Embedded Resistor Measurement 1 Ù to 10 k Ù (Resistor Values to be defi ned in ADAM II)