Octal-Density Grid Test System Extra High Density Accuracy Economical Efficiency Automatic Optcal Alignment Low Ohm Testing
Testfield Size Maximum (X x Y) 244 x 325 mm / 9.6” x 12.8” (smaller fi eld sizes available upon request)
Board Handling Minimum board size (X x Y) 50 x 50 mm / 1.97” x 1.97” Maximum board size (X x Y) 284 x 365 mm / 11.2” x 14.4” Minimum board thickness - manual testing 0.1 mm / 0.0039” - automatic testing 0.6 mm / 0.023” Maximum board thickness 8 mm / 0.315”
Testpoints (1 mil = 1 / 1000 inch = 0.025 mm) one side / both sides 35 mil (800 testpoints / inch²) 98,304 / 196,608
Test Parameters Test Voltage 40 to 250 VDC Continuity Threshold 10 Ω to 10 k Ω Isolation Threshold 100 k Ω to 100 M Ω Embedded Resistor Measurement 1 Ω to 10 k Ω (Resistor Values to be defi ned in ADAM II)