Double and Quad Density Grid Test System Medium to High Density Accuracy Test Area up to 406 x 325 mm Economical
Testfield Size Maximum (Y x X) 406 x 325 mm / 16” x 12.8” (smaller fi eld sizes available upon request)
Board Handling Minimum board size (Y x X) 50 x 50 mm / 1.97” x 1.97” Maximum board size (Y x X) 540 x 460 mm / 21.26” x 18.1” Minimum board thickness - manual testing 0.1 mm / 0.0039” - automatic testing 0.6 mm / 0.023” Maximum board thickness 8 mm / 0.315”
Testpoints (1 mil = 1 / 1000 inch = 0.025 mm) one side / both sides In pure 70 mil (200 testpoints / inch˛) 40,960 / 81,920 In Share Grid® 70 / 50 mil 81,920 / 163,840 (200 / 400 testpoints / inch˛) In pure 50 mil grid (400 testpoints / inch˛) 81,920
Test Parameters Test Voltage 40 to 250 VDC Continuity Threshold 10 Ω to 10 k Ω Isolation Threshold 100 k Ω to 100 M Ω Embedded Resistor Measurement 1 Ω to 10 k Ω (Resistor Values to be defi ned in ADAM II)